The reliability testing of high-voltage ceramic capacitors, also known as aging testing or life testing, covers multiple aspects of testing content to ensure its stability and reliability in practical applications.Following process by many world top clients who using HVC's capacitor in their critical circuit.
Series resistance testing and insulation resistance testing: These tests are used to evaluate the electrical performance of capacitors. The series resistance test is used to measure the equivalent series resistance of capacitors to ensure their normal operation in the circuit. Insulation resistance testing is used to evaluate the insulation performance of capacitors to ensure that they do not experience leakage in high-voltage environments.
Tensile test: This test aims to evaluate the firmness of capacitor leads and chip soldering. By simulating the stress situation of capacitors in actual use by applying tensile force, a firm and reliable connection between the leads and the chip is ensured.
Positive and negative temperature change rate test: This test is used to evaluate the performance stability of capacitors at different temperatures. By exposing the capacitor to a temperature range of -40 °C to +60 °C and measuring the rate of change of its capacitance value, the reliability of the capacitor in different temperature environments is ensured.
Aging test: This test is a long-term operation test on high-voltage ceramic capacitors under simulated actual working environment conditions. Normally, it runs continuously for 30 to 60 days to test the attenuation of various parameters of the capacitor to evaluate its performance stability in long-term use.
Voltage withstand test: This test includes a 24-hour working test at the rated working voltage to ensure the reliability of the capacitor at the rated voltage. In addition, a breakdown voltage withstand test is also conducted, which applies a voltage higher than its rated voltage to the capacitor until it experiences breakdown. The critical voltage before breakdown is the breakdown voltage, which is used to evaluate the withstand voltage capability of capacitors.
Partial discharge test: This test is used to detect the partial discharge of capacitors. By applying high voltage and observing the presence of partial discharge, the insulation performance and stability of the capacitor can be evaluated.
Life testing: This test is conducted on the basis of aging testing, by conducting rapid charging and discharging tests on capacitors under high-frequency impulse current to evaluate their charging and discharging life. By recording the number of charging and discharging times, the charging and discharging life of the capacitor can be obtained. It should be noted that the evaluation of this lifespan is obtained after long-term aging testing.
By conducting these reliability tests on high-voltage ceramic capacitors, their stability and reliability in various working environments can be ensured, thus meeting the requirements of electronic devices for high-performance and long-life capacitors. These tests are an important part of the product development and quality control process for capacitor manufacturers and electronic equipment manufacturers.
